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Overview of the Repository

The Metrics Data Program Data Repository is a database that stores problem data, product data and metrics data.

The primary goal of the repository is to provide project non-specific data to the software community.

The data that is made available to general users has been sanitized and authorized for publication through the MDP website by officials representing the projects from which the data has originated. The database uses unique numeric identifiers to describe individual problem records and product entries. Projects are given a pseudo-name and can also be referred to with unique numeric identifiers. The level of abstraction allows data associations to be made without having to reveal specific information about the originating data.

The database is available to the software community through the Metrics Data Program website.

Users will have to register to access the database via the MDP website. Registered users can then access the data by way of a query building process. The query builder ensures that the user obtains a set of data that meets their requirements.

The Metrics Data Program will establish procedures to handle requests for additional data on a case-by-case basis.

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Summary of data stored in the repository:

• Storage of product data preserves real world hierarchical relationships between products (e.g. CSC-CSCI-File-Class-Module-Requirement).
• Problem data collected throughout entire problem life cycle, i.e. each problem record's history is made available.
  • Detailed description of each problem's history.
  • Dates for each history entry.
  • Problem state change information (e.g. New->Open,Verify->Close).
• Problem records are associated to products impacted by the problem resulting in problem association with the product's corresponding metrics data.
• 2700 plus error reports available spanning 8 years.
• Approximately 14,000 products stored in database.
• 27 different metrics values for products.
• 10 different metrics values for classes.
• 9 different metrics values for requirements.
• 2400 different products associated with problem data.
• 100 different products associated with requirement data.
• 5 additional error related metrics values for each product associated with problem data.

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Problem fields currently available:

• Unique numeric problem identifier
• Severity
• Priority
• Defect state change data
  • Date which the state change occurred
  • Detail of the state change (i.e. from state --> to state)
  • Severity and priority of the problem at the time of state change
• Current defect state (Closed in most cases)
• Data available at the time the problem was opened
  • Date problem record was opened
  • Severity and priority of the problem at the time of opening
  • Activity during which problem was discovered (e.g. "testing")
  • Conditions which may have triggered the problem (e.g. "hardware configuration")
• Change Control Board meeting information (dates, comments)
• Data available at the time the problem was closed
  • Date problem record was closed
  • Severity and priority of the problem at the time of closing
  • The specific type of the problem (e.g. "software bug")
  • The product(s) affected by the problem

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Product fields currently available:

• Unique numeric product identifier
• The project in which the product was developed
• Programming language in which the product was developed
• The level in the design hierarchy which the product represents (e.g. "CSC")
• The version of the product (currently only one version of each product)

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Requirement fields currently available:

• Unique numeric requirement identifier
• The project in which the requirement was developed

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Product Metrics values currently available:

• McCabe Software Metrics
  • Cyclomatic Complexity - V(g)
  • Cyclomatic Density Metric - Vd(g)
  • Decision Density Metric - Dd(g)
  • Design Density Metric - Id(g)
  • Essential Complexity - Ev(g)
  • Essential Density Metric - Ed(g)
  • Global Data Density Metric - Gd(g)
  • Global Data Complexity Metric - Gdv(g)
  • Maintenance Severity
  • Module Design Complexity - Iv(g)
  • Normalized Cyclomatic Complexity Metric - Norm V(g)
  • Pathological Complexity Metric - Pv(g)
• Error Count Metrics
  • Number of Errors (# associated problem records)
  • Error Density (#errors per 1000 lines of code)
  • Number of Problem Records in 6 Months
  • Number of Problem Records in 1 Year
  • Number of Problem Records in 2 Years
• Halstead Metrics
  • Halstead Length (N)
  • Halstead Volume (V)
  • Halstead Level (L)
  • Halstead Difficulty (D)
  • Halstead Intellegent Content (I)
  • Halstead Programming Effort (E)
  • Halstead Error Estimate (B)
  • Halstead Programming Time (T)
• Line of Code Metrics
  • Branch Count
  • Call Pairs
  • Condition Count
  • Decision Count
  • Edge Count
  • Formal Parameter Count
  • Modified Condition Count
  • Multiple Condition Count
  • Node Count
  • Number of Lines
  • Number of Operators
  • Number of Operands
  • Number of Unique Operators
  • Number of Unique Operands
  • Number of Executable of Lines of Code
  • Number of Lines of Comment
  • Number of Lines of Code containing both Code and Comment
  • Number of Lines of Comment
  • Percent of Code that is Comments
  • Total Number of Blank Lines
  • Total Number of Lines of Code

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Object Oriented Class Metrics values currently available:

• Number of Children (NOC)
• Depth (DEPTH)
• Response For Class (RFC)
• Weighted Methods Per Class (WMC)
• Coupling Between Objects (CBO)
• Lack of Cohesion of Methods (LOCM)
• Number of Parents (FAN_IN)
• Access to Public (PUB_ACCESS)
• Percent Public Data (PERCENT_PUB_DATA)
• Classes Dependent on Children (DEP_ON_CHILD)

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Requirement Metric values currently available:

• Action
• Conditional
• Continuance
• Imperative
• Incomplete
• Option
• Risk Level
• Source
• Weak Phrase

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Data associations currently available:

• Orthogonal Defect Classification information associated with problems
• Problems associated with products
• Products associated with metrics
• Products associated with each other reflecting real-world hierarchy
• Products associated with Requirements

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